Live recording of Dr. Malcolm Abbotts presentation from the 53rd IEEE PVSC 2025 in Montreal, covering spectral correction methods for yield forecasting of perovskite-silicon tandem solar modules. The talk explores how spectral effects are significantly stronger in tandems compared to conventional silicon cells, and demonstrates integration approaches for both advanced simulation software and industry-standard tools like PVSyst.

This video serves as a tutorial to using the new optimisation tool in SunSolve Power.

Learn how to model non-uniform ground reflectivity in SunSolve-Yield using custom objects and material settings. This tutorial shows the impact of spatially varying albedo on bifacial module performance with clear, step-by-step guidance.

This video show you how you to sweep inputs in SunSolve-Power. It also highlights how the user interface for this changed in version 7.

This video shows you how you to solve AC using SunSolve Yield accounting for both cell-to-cell and module-to-module mismatch

This video show you how you can to rapidly calculate the bifacial adjustment factors required by PVSyst to deal with the complexities presented by real-world bifacial installations

This video describes the different types of modules that can be simulated in SunSolve-Yield

This video describes the process to load weather from a csv file. The csv file could be generated from a variety of sources such as Meteonorm, Solcast, SolarGIS and NRELs National Solar Radiation Database.

This video walks you through the steps to create and run your first yield simulation

This video describes in more detail the inputs used define a SAT system

There are two types of optical absorption in a semiconductor: band-to-band absorption (which can contribute to light generated current) and free-carrier absorption (which does not contribute to current generation and thus represents a loss mechanism).

This video provides an overview of how to manage custom data sets within SunSolve-Power. Custom data sets can be entered for the refractive index of a material, the reflection and transmission of an interface, the spectrum of incident light, and the collection efficiency of a layer.